Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Goniophotometer
Hangzhou Hopoo Optoelectronics Technology Co., Ltd
This system uses the method of fixing the detector and rotating the lamp under test to measure the light intensity distribution of the light source or lamp under test in all directions in the space. The main shaft and the lamp shaft adopt the conductive slip ring with precious metal fiber point brush structure, which can run 360 degrees continuously without backlash for measurement. There is no need to rotate back and forth to prevent winding and never winding. According to the requirements of t...show more -
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Vehicle Test Systems
What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Test for Pacemakers
VXI-based functional test system for testing implantable medical electronic products. The system is equipped with a Virginia Panel Series 90 adapter interface and can be operated standalone as well as on handling systems. Based on the previously developed matrix-based standard architecture, a large number of systems were supplied. The system function can be verified at any time via an automated self-test.
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Discrete Devices High-speed Testing System
QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Haptic Testing System
The Air Ventilator Haptic Test System performs automatic functional tests on air ventilation components to measure the force necessary for the execution of movements in the different components of the part. The movements are performed by a 6-axis robot that forces the components of the part to follow the desired routes while storing data on the force expended. This particular machine tests movable fins and knurled wheels by performing four test motions on each fin and two on each wheel.
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Testing Software
IEC 61850
Beijing GFUVE Electronics Co.,Ltd.
Intelligent substation has widely adopted IEC 61850 standard communication, the standardization of information model is the basis for intelligent substation equipment (or system) to achieve IEC 61850 communication. This module can test if the information model meet the requirements of DL/T860 standard, national network and related model specifications. It can test and control unit model, protection unit model, econometric model, condition monitoring model. It is selectable to test according to IEC61850-6 SCL grammatical rules, IEC61850-7 logic nodes and common data, the national network model standards and custom models.
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Electronic Primary Injection Test Set
eKAM
eKAM is the new fully automatic electronic primary injection test equipment. e KAM test system includes two portable units: one control unit with a large graphical display, that adjusts the output, and one current unit (up to 2000, 3000, 5000A). It can also perform Step and Touch tests and ground resistance tests.
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PXI Precision Resistor Module 3-Channel, 2.5 to 773k
40-297-143
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Low Frequency Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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3D Motion and Deformation Sensor
ARAMIS
ARAMIS is a non-contact and material-independent measuring system based on digital image correlation (DIC). It offers a stable solution for full-field and point-based analyses of test objects of just a few millimeters up to structural components of several meters in size. The system performs high-precision measurements with a 3D image resolution in the submicrometer range, regardless of the specimen’s geometry and temperature. There is no need for a time-consuming and expensive preparation. For statically or dynamically loaded specimens and components, ARAMIS provides accurate
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LST-2000 Laser Safety Test System
Hangzhou Everfine Photo-E-Info Co., LTD
The system can measure the spectral power distribution, radiant power, radiant energy, apparent light source size, pulse energy and other parameters of the laser light source, and classify the laser light source according to the standard IEC 60825.1. Because laser measurement involves more condition parameters, limit calculation and judgment process is complex, so this system adopts systematic design, the measurement complexity is simplified, the hardware adopts componentization module, users on...show more -
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50 Pin Breakout Interface
VSI-Breakout-50
The VSI-Breakout-50 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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PXI 5W Programmable Resistor Module, 2-Channel, 2Ω to 26.7kΩ
40-252-032
The 40-252-032 is a programmable resistor module with 2 channels which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module
784191-01
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
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Fuel Injection Tester
FIT13APB
This basic fuel injection tester includes large and small Schrader adapters, M6-1.00 O-ring adapter, and tee manifoldIncludes everything necessary to test the following systems: American Motors; Bosch AFC, MPC European and Japanese (except CIS- use our FIT447); Chrysler Corporation; Ford Motor Company; GM (except TBI- use our FIT446)
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Gravity Test Handlers
Microtec offers a wide variation of customizable gravity handlers. The focus of our systems is based on the approach to provide 1 system for many different applications. By pursuing continuous improvements and setting the objective to provide our customers the most convincing test handlers, we are always driven to push our products and its features to the limits and exceed traditional boundaries.
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IR/Visible Ranging Projectors
SBIR offers various ranging test bench systems that can be configured for non-infinity focus testing. Each system can be specifically designed for various tasks including characterizing the performance of IR and visible sensors and performing multi-sensor boresighting (IR to Visible to Laser).
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BGA Sockets
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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Automotive Supply Simulation System
Spitzenberger & Spies GmbH & Co. KG
The modularly constructed Automotive Supply Simulation System is a compact EMC-Test System for the execution of immunity measurements for pulse-shaped, line conducted disturbances at electronic equipment of motor vehicles. The high performance version enables tests of current-intense consumers or even complete vehicles
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Programmable Withstanding Voltage & Insulation Test
LS9923
LS9923 programmable withstanding voltage & insulation test system is high-performance testing device special for AC&DC Withstanding Voltage and Insulation Resistance Test, It allows setting the output voltage. The warning value,testing time and some other parameters can be set in the screen.It with a variety of automatic test functions. The testing is quick and high accuracy which is not only applied in the production line but also in the develop research.
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PXI High-Density Multiplexer: 64-ch, 2-Wire, 100Vrms/1A, Reed Relays
M9101A
The M9101A, a high-density, 64-channel PXI multiplexer routes many different channels to a single point. The switches operate in a break-before-make mode that ensures no two points are connected at the same time or, if needed multiple channels can connect simultaneously. Ideal for routing multiple analog signals to a measurement device in automated test environment (ATE) or data acquisition systems. Each channel switches a high and a low for 2-wire switching up to 100Vrms, with up to 10W of power. Connection options include the durable connector block or the standard cable connections.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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PXI Programmable Power Supply
PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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Fibre Channel Modules
AIM’s Fibre Channel test, simulation and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive and scalable DDR3 memory and IRIG-B time encoder/decoder functions are standard. The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function...show more -
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Generators and Sources
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable...show more -
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...show more
